If you use XICSRT for work leading to a publication, please use the following citation:
N. A. Pablant, M. Bitter, P. C. Efthimion, L. Gao, K. W. Hill, B. F. Kraus, J. Kring, M. J. MacDonald, N. Ose, Y. Ping, M. B. Schneider, S. Stoupin, and Y. Yakusevitch, “Design and expected performance of a variable-radii sinusoidal spiral x-ray spectrometer for the National Ignition Facility”, Review of Scientific Instruments 92, 093904 (2021) https://doi.org/10.1063/5.0054329
List of Publications¶
- N. A. Pablant, M. Bitter, P. C. Efthimion, L. Gao, K. W. Hill, B. F. Kraus, J. Kring, M. J. MacDonald, N. Ose, Y. Ping, M. B. Schneider, S. Stoupin, and Y. Yakusevitch, “Design and expected performance of a variable-radii sinusoidal spiral x-ray spectrometer for the National Ignition Facility”, Review of Scientific Instruments 92, 093904 (2021) https://doi.org/10.1063/5.0054329
- N. A. Pablant, A. Langenberg, J. A. Alonso, M. Bitter, S. A. Bozhenkov, O. P. Ford, K. W. Hill, J. Kring, O. Marchuck, J. Svensson, P. Traverso, T. Windisch, Y. Yakusevitch, and the W7-X Team, “Correction and verification of x-ray imaging crystal spectrometer analysis on Wendelstein 7-X through x-ray ray tracing”, Review of Scientific Instruments 92, 043530 (2021) https://doi.org/10.1063/5.0043513
- J. Kring, N. Pablant, A. Langenberg, J. Rice, L. Delgado-Aparicio, D. Maurer, P. Traverso, M. Bitter, K. Hill, and M. Reinke, “In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X”, Review of Scientific Instruments 89, 10F107 (2018) https://doi.org/10.1063/1.5038809